Oskar Amster
at KLA Corp
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 27 August 2014
Proc. SPIE. 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
KEYWORDS: Dielectrics, Microwave radiation, Atomic force microscopy, Graphene, Modulation, Microscopy, Thin films, Calibration, Crystal optics, Metrology

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top