Othmar Frey
at Univ of Zurich
SPIE Involvement:
Journal Editorial Board Member | Author
Publications (1)

Proceedings Article | 12 October 2005
Proc. SPIE. 5980, SAR Image Analysis, Modeling, and Techniques VII
KEYWORDS: Radar, Data modeling, Backscatter, Sensors, Calibration, Synthetic aperture radar, Image processing, Radiometric corrections, Antennas, Systems modeling

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