Ozan Akdemir
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 March 2019
Proc. SPIE. 10919, Oxide-based Materials and Devices X
KEYWORDS: Wafer-level optics, Titanium dioxide, Silicon, Spectroscopic ellipsometry, Diodes, Atomic layer deposition, Chemical analysis, Semiconducting wafers, Heterojunctions, Temperature metrology

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