Prof. P. Douglas Yoder
Associate Professor Microelectronics/Microsystems at Georgia Institute of Technology
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | April 19, 2017
Proc. SPIE. 10104, Gallium Nitride Materials and Devices XII
KEYWORDS: Light emitting diodes, Ultraviolet radiation, Photons, Semiconductor lasers, Process control, Distributed Bragg reflectors, Laser damage threshold, Vertical cavity surface emitting lasers, Optical microcavities, Oxidation

PROCEEDINGS ARTICLE | February 26, 2016
Proc. SPIE. 9748, Gallium Nitride Materials and Devices XI
KEYWORDS: Light emitting diodes, Metals, Ultraviolet radiation, Silicon, Resistance, Reflectivity, Gallium nitride, Vertical cavity surface emitting lasers, Metalorganic chemical vapor deposition, Applied physics

PROCEEDINGS ARTICLE | February 27, 2014
Proc. SPIE. 9002, Novel In-Plane Semiconductor Lasers XIII
KEYWORDS: Reflectors, Deep ultraviolet, Ultraviolet radiation, Coating, Reflectivity, Aluminum, Aluminum nitride, Laser damage threshold, Optical pumping, Metalorganic chemical vapor deposition

PROCEEDINGS ARTICLE | March 4, 2013
Proc. SPIE. 8625, Gallium Nitride Materials and Devices VIII
KEYWORDS: Deep ultraviolet, Polarization, Semiconductor lasers, Sapphire, Aluminum nitride, Laser damage threshold, Optical pumping, Silicon carbide, Metalorganic chemical vapor deposition, Laser optics

PROCEEDINGS ARTICLE | March 18, 2010
Proc. SPIE. 7602, Gallium Nitride Materials and Devices V
KEYWORDS: Electron beam lithography, Quantum wells, Waveguides, Cladding, Electroluminescence, Semiconductor lasers, Gallium nitride, Sapphire, Indium gallium nitride, Structural design

PROCEEDINGS ARTICLE | November 7, 2007
Proc. SPIE. 6739, Electro-Optical Remote Sensing, Detection, and Photonic Technologies and Their Applications
KEYWORDS: Avalanche photodetectors, Ultraviolet radiation, Gallium nitride, Sapphire, Aluminum, Aluminum nitride, Metalorganic chemical vapor deposition, Gallium, Ultraviolet detectors, Absorption

Showing 5 of 8 publications
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