Mr. Paresh Chandra Chandra Pradhan
Ph. D Student at Raja Ramanna Centre for Advanced Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10386, Advances in X-Ray/EUV Optics and Components XII
KEYWORDS: Multilayers, Reflectors, X-rays, Optical lithography, Sputter deposition, Reflectivity, Atomic force microscopy, Silicon, X-ray optics, Structural analysis

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