Pan YE
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 24, 2014
Proc. SPIE. 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
KEYWORDS: Detection and tracking algorithms, Phase modulation, Visualization, Imaging systems, Cameras, Calibration, Feature extraction, Image filtering, Stereo vision systems, Ranging

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