Dr. Partha P. Banerjee
Professor of ECE at Univ of Dayton
SPIE Involvement:
Fellow status | Conference Program Committee | Author
Publications (119)

SPIE Journal Paper | June 27, 2018
OE Vol. 57 Issue 06
KEYWORDS: Liquids, Optical trapping, Geometrical optics, Particles, Nanoparticles, Continuous wave operation, Temperature metrology, Glasses, Thermography, Optical engineering

SPIE Journal Paper | May 21, 2018
OE Vol. 57 Issue 05
KEYWORDS: Polarization, Composites, Satellites, Statistical analysis, Solar cells, Vector spaces, Distance measurement, Polarimetry, Calibration, Antennas

PROCEEDINGS ARTICLE | February 23, 2018
Proc. SPIE. 10526, Physics and Simulation of Optoelectronic Devices XXVI
KEYWORDS: Metamaterials, Metals, Dielectrics, Wavefronts, Wave propagation, Beam propagation method, Electromagnetism, Anisotropy

PROCEEDINGS ARTICLE | February 19, 2018
Proc. SPIE. 10520, Laser-based Micro- and Nanoprocessing XII
KEYWORDS: Microfluidics, Optical lithography, Nanoparticles, Laser processing, Laser ablation, Thermal modeling, Beam analyzers, Liquids

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10396, Applications of Digital Image Processing XL
KEYWORDS: Holograms, Holography, Digital holography, Image processing, Clouds, Tomography, Zoom lenses, Digital recording, Virtual reality, 3D image processing

PROCEEDINGS ARTICLE | August 30, 2017
Proc. SPIE. 10407, Polarization Science and Remote Sensing VIII
KEYWORDS: Statistical analysis, Polarization, Remote sensing, Polarimetry, Near field, Target recognition, Vector spaces, Polarization analysis

Showing 5 of 119 publications
Conference Committee Involvement (19)
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII
19 August 2018 | San Diego, California, United States
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI
6 August 2017 | San Diego, California, United States
Digital Optical Technologies
26 June 2017 | Munich, Germany
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
International Workshop on Thin-Films for Electronics, Electro-Optics, Energy and Sensors
25 June 2017 | Dayton, Ohio, United States
Showing 5 of 19 published special sections
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