Prof. Partha P. Banerjee
Professor at Univ of Dayton
SPIE Involvement:
Conference Program Committee | Author | Editor
Publications (135)

Proceedings Article | 23 April 2020
Proc. SPIE. 11389, Micro- and Nanotechnology Sensors, Systems, and Applications XII
KEYWORDS: Ultrafast phenomena, Photodetectors, Metals, Dielectrics, Electrons, Quantum efficiency, Photodiodes, Diodes, Antennas, Nanorods

Proceedings Article | 21 February 2020
Proc. SPIE. 11305, Ultra-High-Definition Imaging Systems III
KEYWORDS: Diffraction, Coherence imaging, Holograms, Optical sensors, Digital holography, Sensors, Wavefront sensors, Additive manufacturing, Phase retrieval, Reconstruction algorithms

Proceedings Article | 20 February 2020
Proc. SPIE. 11233, Optical Fibers and Sensors for Medical Diagnostics and Treatment Applications XX
KEYWORDS: Signal to noise ratio, Optical fibers, Neck, Refractive index, Cancer, Molecules, Fiber optics sensors, Head, Biological research, Phase shifts

Proceedings Article | 14 February 2020
Proc. SPIE. 11249, Quantitative Phase Imaging VI
KEYWORDS: Fringe analysis, Image processing, Fourier transforms, Phase retrieval, Computed tomography, 3D image processing, Phase shifts

Proceedings Article | 9 September 2019
Proc. SPIE. 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII
KEYWORDS: Optical filters, Metals, Matrices, Crystals, Dielectrics, Silver, Reflectivity, Transmittance, Tunable filters, Electro optics

Showing 5 of 135 publications
Proceedings Volume Editor (1)

Conference Committee Involvement (25)
Ultra-High-Definition Imaging Systems IV
23 January 2021 | San Francisco, California, United States
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIV
24 August 2020 | Online Only, California, United States
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII
11 August 2019 | San Diego, California, United States
Digital Optical Technologies II
24 June 2019 | Munich, Germany
Optical Measurement Systems for Industrial Inspection XI
24 June 2019 | Munich, Germany
Showing 5 of 25 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top