Pascal Gilgenkrantz
HPC&Cloud Product Manager for Calibre Semi-Manuf. at Siemens EDA
SPIE Involvement:
Publications (6)

Proceedings Article | 10 April 2024 Presentation + Paper
Pascal Gilgenkrantz, Bassem Riad, Maram Salah, Azim Siddique
Proceedings Volume 12954, 129540O (2024)
KEYWORDS: Clouds, Electronic design automation, Optical proximity correction, Simulations, Lithography, Computer hardware, Organization management, Photomasks, Statistical analysis, Signal processing

Proceedings Article | 28 April 2023 Poster + Paper
Proceedings Volume 12495, 124951O (2023)
KEYWORDS: Data analysis, Data modeling, Machine learning, Feature extraction

Proceedings Article | 3 October 2018 Presentation + Paper
Proceedings Volume 10810, 108100L (2018)
KEYWORDS: Distributed computing, Data processing, Data storage servers, Data communications, Computing systems, Optical proximity correction

Proceedings Article | 19 September 2018 Paper
Proceedings Volume 10775, 1077513 (2018)
KEYWORDS: Optical proximity correction, Lithography, Photomasks, Visualization, Manufacturing, Network architectures, Electronic design automation, Operating systems

Proceedings Article | 19 March 2015 Paper
Proceedings Volume 9424, 94241C (2015)
KEYWORDS: Semiconducting wafers, Scanners, Sensors, Data modeling, Finite element methods, Silicon, Wafer-level optics, Convolution, Photomasks, Chemical mechanical planarization

Showing 5 of 6 publications
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