Prof. Patricia M. Nieva
Associate Professor at Univ of Waterloo
SPIE Involvement:
Area of Expertise:
Optical Fiber Sensors , Micro and Nano Sensors , Micro and Nano Fabrication , Localized Surface Plasmon Resonance Sensors , Evanescent Wave Sensors , Micro and Nano Materials Characterization
Profile Summary

Dr. Patricia Nieva received her Bachelor Degree in Mechanical and Electrical Engineering in the Universidad Nacional de Ingenieria, Lima, Peru. She received her M.Sc. degree in Mechanical Engineering and Ph.D. degree in Electrical Engineering from Northeastern University, Massachusetts, USA. She is currently an Associate Professor in the Department of Mechanical and Mechatronics Engineering and the Director of the Sensors and Integrated Microsystems Laboratory at the University of Waterloo, Canada. Her main research goal is the use of micro and nanotechnology to design microsensors, nanosensors and integrated systems solutions, particularly for harsh environment sensing, point-of-care health monitoring and medical diagnosis. Her work also spans reliability studies and in-situ characterization of material properties of thin films used in the manufacturing of N/MEMS. Dr Nieva’s ongoing research work constitutes an important commitment to the identification of simple, cost-effective and reliable technologies for advanced sensing.
Publications (15)

Proceedings Article | 7 March 2014
Proc. SPIE. 8980, Physics and Simulation of Optoelectronic Devices XXII
KEYWORDS: Optical fibers, Refractive index, Finite-difference time-domain method, Waveguides, Fiber optics, Cladding, Sensors, Fiber optics sensors, Wave sensors, Electromagnetism

Proceedings Article | 7 March 2014
Proc. SPIE. 8977, MOEMS and Miniaturized Systems XIII
KEYWORDS: Actuators, Gold, Mirrors, Optical lithography, Metals, Silicon, Computer simulations, Micromirrors, Computer aided design, Temperature metrology

Proceedings Article | 7 March 2014
Proc. SPIE. 8982, Optical Components and Materials XI
KEYWORDS: FT-IR spectroscopy, Lithium, Optical properties, Electrodes, Spectroscopy, Ions, Reflectivity, Absorbance, Attenuated total reflectance, System on a chip

Proceedings Article | 7 March 2014
Proc. SPIE. 8980, Physics and Simulation of Optoelectronic Devices XXII
KEYWORDS: Thin films, FT-IR spectroscopy, Light emitting diodes, LED lighting, Reflection, Cladding, Sensors, Interfaces, Refraction, Geometrical optics

SPIE Journal Paper | 26 July 2013
JM3 Vol. 12 Issue 03
KEYWORDS: Photoresist materials, Nanoparticles, Silver, Lithography, Sensors, Metals, Nanolithography, Photomasks, Optical lithography, Semiconducting wafers

Showing 5 of 15 publications
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