Dr. Patrick Egan
at
SPIE Involvement:
Author
Publications (5)

SPIE Journal Paper | December 1, 2006
OE Vol. 45 Issue 12
KEYWORDS: Cameras, Interferometry, Phase measurement, Semiconductor lasers, Mirrors, Phase retrieval, Wavelength tuning, Interferometers, Infrared radiation

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Mirrors, Modulation, Cameras, Interferometry, Phase retrieval, Optical metrology, Heterodyning, Machine vision, Analog electronics

SPIE Journal Paper | January 1, 2006
OE Vol. 45 Issue 01
KEYWORDS: Cameras, Optical coherence tomography, Digital signal processing, Signal processing, Signal to noise ratio, Semiconductors, Optical signal processing, Optical filters, Light sources, 3D image processing

PROCEEDINGS ARTICLE | June 13, 2005
Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV
KEYWORDS: Signal to noise ratio, CMOS sensors, Digital signal processing, Cameras, Sensors, Optical coherence tomography, Signal processing, Machine vision, Aluminum, 3D image processing

PROCEEDINGS ARTICLE | June 1, 2005
Proc. SPIE. 5823, Opto-Ireland 2005: Imaging and Vision
KEYWORDS: Signal to noise ratio, CMOS sensors, Digital signal processing, Coherence (optics), Cameras, Sensors, Optical coherence tomography, Glasses, Signal processing, CMOS cameras

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