Mr. James Patrick Flint
Vice President of Technology and Business Dev at Galaxy Compound Semiconductors Inc
SPIE Involvement:
Author
Publications (16)

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Polishing, Statistical analysis, Crystals, Gallium arsenide, Indium, Gallium antimonide, Process control, Epitaxy, Semiconducting wafers, Yield improvement, Compound semiconductors

PROCEEDINGS ARTICLE | May 16, 2017
Proc. SPIE. 10177, Infrared Technology and Applications XLIII
KEYWORDS: Infrared detectors, Oxides, Polishing, Cadmium, Crystals, Manufacturing, Zinc, Epitaxy, Semiconducting wafers, Infrared materials, Tellurium, Compound semiconductors, Surface finishing

PROCEEDINGS ARTICLE | May 20, 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Oxides, Polishing, Etching, Air contamination, Crystals, Chemistry, Gallium antimonide, Semiconducting wafers, Surface finishing, Chemical mechanical planarization

PROCEEDINGS ARTICLE | May 20, 2016
Proc. SPIE. 9819, Infrared Technology and Applications XLII
KEYWORDS: Infrared detectors, Oxides, Infrared imaging, Polishing, Cadmium, Crystals, X-rays, Zinc, Tellurium, Surface finishing, Surface finishing

PROCEEDINGS ARTICLE | June 24, 2014
Proc. SPIE. 9070, Infrared Technology and Applications XL
KEYWORDS: Infrared imaging, Mid-IR, Phase modulation, Crystals, Indium, Gallium nitride, Infrared radiation, Infrared technology, Laser phosphor displays, Current controlled current source

PROCEEDINGS ARTICLE | January 31, 2014
Proc. SPIE. 8993, Quantum Sensing and Nanophotonic Devices XI
KEYWORDS: Staring arrays, Oxides, Infrared imaging, Polishing, Sensors, Crystals, Surface roughness, Semiconducting wafers, Compound semiconductors, Surface finishing

Showing 5 of 16 publications
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