Patrick G. Hogue
Senior Process Engineer at Johns Hopkins Univ
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 7 September 2006
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Contamination, Ultraviolet radiation, Organisms, Nitrogen, Corrosion, Control systems, Microorganisms, Space operations, Natural surfaces, Bacteria

Proceedings Article | 7 September 2006
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Contamination, Statistical analysis, Calibration, Spectroscopy, Nitrogen, Coating, Solids, Chemical analysis, Fiber coatings, Liquids

Proceedings Article | 7 September 2006
Proc. SPIE. 6291, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
KEYWORDS: Particles, Silicon, Aluminum, Sodium, Silicon carbide, Chlorine, Space operations, Atmospheric particles, Pluto, Picture Archiving and Communication System

Proceedings Article | 22 September 2005
Proc. SPIE. 5906, Astrobiology and Planetary Missions
KEYWORDS: Telescopes, Mirrors, Imaging systems, Sensors, Space telescopes, Aluminum, Charge-coupled devices, Silicon carbide, Space operations, Pluto

Proceedings Article | 15 October 2004
Proc. SPIE. 5526, Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
KEYWORDS: Imaging systems, Glasses, Particles, Image analysis, Optical inspection, Optical scanning systems, Space operations, Semiconducting wafers, Contamination control, Instrument modeling

Showing 5 of 6 publications
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