Dr. Patrick Lambelet
CTO at Heliotis AG
SPIE Involvement:
Area of Expertise:
Optics , Optical Coherence Tomography , Interferometry
Publications (12)

Proceedings Article | 13 May 2013 Paper
Marc Honegger, Michael Kahl, Sandra Trunz, Stefan Rinner, Andreas Ettemeyer, Patrick Lambelet
Proceedings Volume 8788, 878814 (2013) https://doi.org/10.1117/12.2020260
KEYWORDS: Cameras, Projection systems, Light emitting diodes, Image acquisition, 3D metrology, Inspection, Content addressable memory, Calibration, Imaging systems, Semiconducting wafers

Proceedings Article | 13 May 2013 Paper
Patrick Lambelet, Rudolf Moosburger
Proceedings Volume 8788, 87880Q (2013) https://doi.org/10.1117/12.2020617
KEYWORDS: Cameras, Optical interferometry, Inspection, Mirrors, Interferometry, Demodulation, Interferometers, Scanners, Data acquisition, Near field optics

Proceedings Article | 3 November 2011 Paper
Proceedings Volume 8011, 80117O (2011) https://doi.org/10.1117/12.903256
KEYWORDS: Semiconducting wafers, Interferometers, Inspection, Diffractive optical elements, Wafer-level optics, Imaging systems, Interferometry, Lithium, Microelectromechanical systems, Micro optics

Proceedings Article | 27 May 2011 Paper
Sandra Caspar, Marc Honegger, Stefan Rinner, Patrick Lambelet, Carlo Bach, Andreas Ettemeyer
Proceedings Volume 8082, 80820Y (2011) https://doi.org/10.1117/12.888930
KEYWORDS: Cameras, Inspection, Light emitting diodes, Modulation, Phase shifts, Image acquisition, Fringe analysis, Projection systems, 3D metrology, Imaging systems

Proceedings Article | 27 May 2011 Paper
Proceedings Volume 8082, 80820X (2011) https://doi.org/10.1117/12.889390
KEYWORDS: Optical coherence tomography, Interferometers, Cameras, Inspection, 3D metrology, 3D vision, CMOS cameras, Solar cells, Modulation, Sensors

Showing 5 of 12 publications
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