Mr. Patrick V. Lyles
at Davidson Technologies Inc
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | May 16, 2006
Proc. SPIE. 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI
KEYWORDS: Human-machine interfaces, Electronics, Visualization, Sensors, Video, Projection systems, Infrared radiation, High dynamic range imaging, Commercial off the shelf technology, Diffusion tensor imaging

PROCEEDINGS ARTICLE | May 20, 2005
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Infrared imaging, Data modeling, Visualization, Sensors, Infrared radiation, Missiles, Laser imaging, Computer architecture, Commercial off the shelf technology, OpenGL

PROCEEDINGS ARTICLE | May 20, 2005
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Infrared imaging, Data modeling, Visualization, Sensors, Computer simulations, Infrared lasers, Projection systems, Optical simulations, Missiles, Computer architecture

PROCEEDINGS ARTICLE | September 12, 2003
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Human-machine interfaces, Infrared imaging, Visualization, Sensors, Computing systems, Computer simulations, Infrared radiation, Missiles, Operating systems, Commercial off the shelf technology

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