Dr. Patrick G. McNamara
Director of Sales at OEwaves Inc
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 July 2003
Proc. SPIE. 5042, Design and Process Integration for Microelectronic Manufacturing
KEYWORDS: Statistical analysis, Manufacturing, Process control, Transistors, Field effect transistors, Statistical modeling, System on a chip, Device simulation, Instrument modeling, Design for manufacturability

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