Dr. Patrick C. Mock
Sr Scientist at RAM Photonics LLC
SPIE Involvement:
Conference Program Committee | Author
Publications (2)

PROCEEDINGS ARTICLE | May 31, 2013
Proc. SPIE. 8713, Airborne Intelligence, Surveillance, Reconnaissance (ISR) Systems and Applications X
KEYWORDS: Signal to noise ratio, Optical transfer functions, Point spread functions, Imaging systems, Spatial frequencies, Image processing, Image filtering, Deconvolution, Modulation transfer functions, Image deconvolution

PROCEEDINGS ARTICLE | May 5, 2012
Proc. SPIE. 8358, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing XIII
KEYWORDS: Microbolometers, Infrared imaging, Mid-IR, Visualization, Imaging systems, Cameras, Quantum cascade lasers, Chemical analysis, Biological research, Absorption

Conference Committee Involvement (4)
Photonic Instrumentation Engineering VI
2 February 2019 | San Francisco, California, United States
Photonic Instrumentation Engineering V
30 January 2018 | San Francisco, California, United States
Photonic Instrumentation Engineering IV
31 January 2017 | San Francisco, California, United States
Photonic Instrumentation Engineering III
17 February 2016 | San Francisco, California, United States
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