Dr. Patrick I. Oden Profile

Dr. Patrick I. Oden

TI Fellow at Texas Instruments Inc

SPIE Involvement:

Author | Editor

Proceedings Article | 13 March 2024 Presentation + Paper

Optimizing a micro electro mechanical system (MEMS) based phase-only light modulator (PLM) for improved system performance

Taylor Byrum, Kristofer Oberascher, Zachary Walker, Alex Lyubarsky, Sam Martin, Griffin Orr, William McDonald, Nathan Gilly, Sean O'Brien, Kelly Taylor, Wesley Hamlin, Patrick Oden, James Hall

Proceedings Volume 12900, 129000D (2024) https://doi.org/10.1117/12.3003885

KEYWORDS: Mirrors, Diffraction, Manufacturing, Design, Mirror surfaces, Modulators, Microelectromechanical systems, Incident light, Equipment, Digital Light Processing

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Proceedings Article | 2 March 2022 Presentation + Paper

Reliability assessment of the Texas Instruments phase light modulator

Michael Douglass, James Hall, Patrick Oden, Taylor Byrum

Proceedings Volume 12014, 1201405 (2022) https://doi.org/10.1117/12.2612227

KEYWORDS: Mirrors, Digital micromirror devices, Reliability, Modulators, Microopto electromechanical systems, Image processing, Packaging, Microelectromechanical systems, Phase modulation, Spatial light modulators

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Proceedings Article | 9 March 2021 Presentation + Paper

Recent advances in the development of the Texas Instruments phase-only microelectromechanical systems (MEMS) spatial light modulator

Terry Bartlett, William McDonald, James Hall, Patrick Oden, Dennis Doane, Remington Ketchum, Taylor Byrum

Proceedings Volume 11698, 116980O (2021) https://doi.org/10.1117/12.2582199

KEYWORDS: Microelectromechanical systems, Quantization, Image quality, Computer generated holography, Reliability, Mirrors, Mirror stabilization, Liquid crystals, Digital micromirror devices, Digital Light Processing

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Proceedings Article | 28 February 2020 Presentation + Paper

Innovations with a massively paralleled, microelectromechanical systems (MEMS) toward piston-mode-based phase light modulator (PLM)

Patrick Oden, Terry Bartlett, William McDonald, James Baker, James Hall

Proceedings Volume 11294, 112940G (2020) https://doi.org/10.1117/12.2550582

KEYWORDS: Mirrors, Electrodes, Microelectromechanical systems, Digital micromirror devices, Modulators, Diffraction, Manufacturing, Phase shift keying, Modulation, Mirror structures

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SPIE Journal Paper | 21 March 2014 Open Access

Special Section Guest Editorial: Emerging MOEMS Technology and Applications

M. Edward Motamedi, Joel Kubby, Patrick Oden, Wibool Piyawattanametha

JM3, Vol. 13, Issue 01, 011101, (March 2014) https://doi.org/10.1117/12.10.1117/1.JMM.13.1.011101

KEYWORDS: Microopto electromechanical systems, Microelectromechanical systems, Micro optics, Mirrors, Photonics, Technologies and applications, Digital micromirror devices, Microsystems, Actuators

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Proceedings Article | 30 April 2008 Paper

Texas Instruments' DLP products massively paralleled MOEMS arrays for display applications: a distant second to Mother Nature

P. Oden

Proceedings Volume 6959, 69590D (2008) https://doi.org/10.1117/12.778499

KEYWORDS: Digital micromirror devices, Mirrors, Spatial light modulators, Visualization, Microopto electromechanical systems, Projection systems, Digital Light Processing, Data storage, Microelectromechanical systems, Reliability

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Proceedings Article | 14 August 2006 Paper

Non-destructive structural homogeneity of MOEMS arrays: applications of a through-transmissive-media interferometer on a digital mirror device-spatial light modulator

L. Heine, P. Oden

Proceedings Volume 6293, 62930C (2006) https://doi.org/10.1117/12.684222

KEYWORDS: Mirrors, Digital micromirror devices, Interferometers, Inspection, Image segmentation, Microopto electromechanical systems, Spatial light modulators, Objectives, Nondestructive evaluation, Digital Light Processing

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Proceedings Article | 4 December 1998 Paper

Chemically sensitive surface plasmon devices employing a self-assembled monolayer composite film

J. DePriest, Fabrice Meriaudeau, Patrick Oden, Todd Downey, A. Passian, A. Wig, Trinidad Ferrell

Proceedings Volume 3491, (1998) https://doi.org/10.1117/12.328625

KEYWORDS: Gold, Surface plasmons, Self-assembled monolayers, Sensors, Composites, Chemical elements, Quartz, Metals, Reflectivity, Nitrogen

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Proceedings Article | 4 December 1998 Paper

Thin metal island plasmon sensor

Fabrice Meriaudeau, Todd Downey, A. Passian, Patrick Oden, A. Wig, P. Crilly, S. Mangeant, Trinidad Ferrell

Proceedings Volume 3491, (1998) https://doi.org/10.1117/12.328749

KEYWORDS: Particles, Gold, Dielectrics, Absorbance, Liquids, Quartz, Metals, Sensors, Refraction, Plasmons

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Proceedings Article | 20 July 1998 Paper

MEMS sensors and wireless telemetry for distributed systems

Charles Britton, R. Warmack, S. Smith, Patrick Oden, Gilbert Brown, W. Bryan, Lloyd Clonts, Michael Duncan, Mike Emery, M. Ericson, Z. Hu, Robert Jones, Michael Moore, J. Moore, Jim Rochelle, Timothy Threatt, Thomas Thundat, Gary Turner, Alan Wintenberg

Proceedings Volume 3328, (1998) https://doi.org/10.1117/12.320161

KEYWORDS: Sensors, Clocks, Amplifiers, Mercury, Capacitance, Data acquisition, Analog electronics, Logic, Microelectromechanical systems, Capacitors

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Proceedings Article | 21 October 1996 Paper

Piezoresistive microcantilever optimization for uncooled infrared detection technology

Slobodan Rajic, Boyd Evans, Panos Datskos, Patrick Oden, Thomas Thundat, Charles Egert

Proceedings Volume 2817, (1996) https://doi.org/10.1117/12.255182

KEYWORDS: Sensors, Infrared sensors, Infrared radiation, Infrared detectors, Thermography, Silicon, Infrared detection, Resistance, Temperature metrology, Finite element methods

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Proceedings Article | 27 June 1996 Paper

Optical and infrared detection using microcantilevers

Patrick Oden, Eric Wachter, Panos Datskos, Thomas Thundat, R. Warmack

Proceedings Volume 2744, (1996) https://doi.org/10.1117/12.243523

KEYWORDS: Sensors, Modulation, Thermography, Infrared detectors, Infrared radiation, Infrared sensors, Coating, Silicon, Temperature metrology, Optics manufacturing

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Proceedings Article | 1 May 1992 Paper

Nanofabrication utilizing the atomic-force microscope

L. Nagahara, Patrick Oden, Arun Majumdar, J. Carrejo, J. Graham, John Alexander

Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58184

KEYWORDS: Atomic force microscopy, Polymethylmethacrylate, Scanning tunneling microscopy, Gold, Lithography, Scanning probe microscopy, Metals, Nanolithography, Nanofabrication, Photoresist materials

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