Dr. Patrick I. Oden Profile

Dr. Patrick I. Oden

Distinguished Member Technical Staff at Texas Instruments Inc

SPIE Involvement:

Symposium Committee | Conference Chair | Conference Program Committee | Author | Editor

Publications (12)

SPIE Journal Paper | March 21, 2014

Special Section Guest Editorial: Emerging MOEMS Technology and Applications

Motamedi, M. Edward , Kubby, Joel , Oden, Patrick , Piyawattanametha, Wibool

JM3 Vol. 13 Issue 01

KEYWORDS: Microopto electromechanical systems, Microelectromechanical systems, Micro optics, Mirrors, Photonics, Technologies and applications, Digital micromirror devices, Microsystems, New and emerging technologies, Actuators

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SPIE Conference Volume | March 15, 2013

Emerging Digital Micromirror Device Based Systems and Applications V

SPIE Conference Volume | March 21, 2012

Emerging Digital Micromirror Device Based Systems and Applications IV

SPIE Conference Volume | February 9, 2011

Emerging Digital Micromirror Device Based Systems and Applications III

PROCEEDINGS ARTICLE | April 30, 2008

Texas Instruments' DLP products massively paralleled MOEMS arrays for display applications: a distant second to Mother Nature

Proc. SPIE. 6959, Micro (MEMS) and Nanotechnologies for Space, Defense, and Security II

KEYWORDS: Microelectromechanical systems, Mirrors, Visualization, Data storage, Reliability, Spatial light modulators, Projection systems, Microopto electromechanical systems, Digital micromirror devices, Digital Light Processing

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PROCEEDINGS ARTICLE | August 14, 2006

Non-destructive structural homogeneity of MOEMS arrays: applications of a through-transmissive-media interferometer on a digital mirror device-spatial light modulator

Proc. SPIE. 6293, Interferometry XIII: Applications

KEYWORDS: Mirrors, Interferometers, Image segmentation, Inspection, Nondestructive evaluation, Spatial light modulators, Objectives, Microopto electromechanical systems, Digital micromirror devices, Digital Light Processing

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PROCEEDINGS ARTICLE | December 4, 1998

Thin metal island plasmon sensor

Proc. SPIE. 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications

KEYWORDS: Gold, Plasmons, Sensors, Quartz, Metals, Particles, Dielectrics, Refraction, Absorbance, Liquids

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PROCEEDINGS ARTICLE | December 4, 1998

Chemically sensitive surface plasmon devices employing a self-assembled monolayer composite film

Proc. SPIE. 3491, 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications

KEYWORDS: Gold, Surface plasmons, Sensors, Quartz, Metals, Composites, Nitrogen, Reflectivity, Chemical elements, Self-assembled monolayers

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PROCEEDINGS ARTICLE | July 20, 1998

MEMS sensors and wireless telemetry for distributed systems

Proc. SPIE. 3328, Smart Structures and Materials 1998: Smart Electronics and MEMS

KEYWORDS: Microelectromechanical systems, Logic, Clocks, Capacitors, Sensors, Mercury, Amplifiers, Data acquisition, Capacitance, Analog electronics

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PROCEEDINGS ARTICLE | October 21, 1996

Piezoresistive microcantilever optimization for uncooled infrared detection technology

Proc. SPIE. 2817, Infrared Spaceborne Remote Sensing IV

KEYWORDS: Infrared detectors, Thermography, Infrared sensors, Sensors, Silicon, Resistance, Finite element methods, Infrared radiation, Infrared detection, Temperature metrology

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PROCEEDINGS ARTICLE | June 27, 1996

Optical and infrared detection using microcantilevers

Proc. SPIE. 2744, Infrared Technology and Applications XXII

KEYWORDS: Infrared detectors, Thermography, Infrared sensors, Modulation, Sensors, Silicon, Coating, Infrared radiation, Optics manufacturing, Temperature metrology

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PROCEEDINGS ARTICLE | May 1, 1992

Nanofabrication utilizing the atomic-force microscope

Proc. SPIE. 1639, Scanning Probe Microscopies

KEYWORDS: Gold, Lithography, Polymethylmethacrylate, Metals, Atomic force microscopy, Photoresist materials, Scanning probe microscopy, Nanofabrication, Nanolithography, Scanning tunneling microscopy

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