Patrick Schäfer
at Technische Hochschule Deggendorf
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 January 2015 Paper
Patrick Schäfer, Christine Wünsche, Rolf Rascher
Proceedings Volume 9442, 944219 (2015) https://doi.org/10.1117/12.2176184
KEYWORDS: Sensors, Optical testing, Radium, Surface finishing, Polishing, Distance measurement, Reliability, Data acquisition, Surface roughness, Signal processing

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