Patrik Johannes Murr
Student at Technische Univ München
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Beam splitters, Imaging systems, Sensors, Image processing, Luminescence, Image resolution, Image filtering, Aluminum, 3D image processing, Bandpass filters

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