Mr. Paul A. Boeder Profile

Paul A. Boeder

at Jet Propulsion Lab

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Author

Publications (5)

Proceedings Article | 4 September 2020 Paper

Preparing for Mars 2020 and future space missions: technology advancements driving contamination control requirements and cleanroom protocols

Thora Maltais, Lauren White, Paul Boeder, Taguhi Arakelian, Mark Anderson, Jerami Mennella, Nicholas Heinz, Vanessa Gomez, Nicole Chen

Proceedings Volume 11489, 114890T (2020) https://doi.org/10.1117/12.2581239

KEYWORDS: Contamination control, Space operations, Mars, Aerospace engineering, Particles

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Proceedings Article | 26 August 2020 Paper

Mars 2020: mission, science objectives and build

Paul Boeder, Carlos Soares

Proceedings Volume 11489, 1148903 (2020) https://doi.org/10.1117/12.2569650

KEYWORDS: Mars, Robotics, Planets, Space operations, New and emerging technologies, Contamination control

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Proceedings Article | 21 August 2020 Presentation + Paper

Predicting terrestrial contamination of the Mars 2020 sample caching system with novel multispecies outgassing and transport models

John Alred, Maxwell Martin, William Hoey, Anthony Wong, Lauren White, Paul Boeder, Savannah Cofer, Adrien Dias-Ribeiro, Carlos Soares

Proceedings Volume 11489, 1148904 (2020) https://doi.org/10.1117/12.2568127

KEYWORDS: Contamination, Molecules, Diffusion, Mars, Statistical modeling, Tin, Carbon, Titanium, Oxides

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Proceedings Article | 19 September 2018 Presentation + Paper

Mars 2020 sample cleanliness molecular transport model

Ira Katz, Mark Anderson, Lauren White, Paul Boeder, William Hoey

Proceedings Volume 10748, 107480A (2018) https://doi.org/10.1117/12.2319857

KEYWORDS: Mars, Molecules, Contamination, Diffusion, Carbon

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Proceedings Article | 15 October 2004 Paper

Effect of a silicone contaminant film on the transmittance properties of AR-coated fused silica

Paul Boeder, James Visentine, Christopher Shaw, Chuck Carniglia, John Alred, Carlos Soares

Proceedings Volume 5526, (2004) https://doi.org/10.1117/12.560859

KEYWORDS: Transmittance, Vacuum ultraviolet, Silicon, Transmission electron microscopy, Scanning electron microscopy, Thin films, Optical testing, Contamination, Lamps, Data modeling

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