Dr. Paul Coudray
President at KLOÉ SA
SPIE Involvement:
Author
Publications (23)

SPIE Journal Paper | September 10, 2013
OE Vol. 52 Issue 09
KEYWORDS: Refractive index, Dispersion, Polymers, Ceramics, Thin films, Ellipsometry, Iron, Polymer thin films, Temperature metrology, Polarization

PROCEEDINGS ARTICLE | October 25, 2012
Proc. SPIE. 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
KEYWORDS: Thin films, Ellipsometry, Refractive index, Prisms, Iron, Dispersion, Polymers, Ceramics, Polymer thin films, Temperature metrology

PROCEEDINGS ARTICLE | May 9, 2012
Proc. SPIE. 8428, Micro-Optics 2012
KEYWORDS: Thin films, Lithography, Diffraction, Titanium dioxide, Interferometry, Photoresist materials, Optical encoders, Photomasks, Sol-gels, Diffraction gratings

PROCEEDINGS ARTICLE | October 1, 2011
Proc. SPIE. 8172, Optical Complex Systems: OCS11
KEYWORDS: Thin films, Refractive index, Prisms, Dispersion, Polymers, Interfaces, Silicon, Silicon films, Photorefractive polymers, Temperature metrology

PROCEEDINGS ARTICLE | February 24, 2009
Proc. SPIE. 7205, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics II
KEYWORDS: Lithography, Microfluidics, Waveguides, Laser applications, Scanning electron microscopy, Photoresist materials, Microlens, Micromirrors, Integrated optics, Multiphoton lithography

PROCEEDINGS ARTICLE | June 18, 2002
Proc. SPIE. 4640, Integrated Optics: Devices, Materials, and Technologies VI
KEYWORDS: Code division multiplexing, Minerals, Optical circuits, Waveguides, Wavelength division multiplexing, Single mode fibers, Integrated optics, Brain-machine interfaces, Multiplexers, Multimode interference devices

Showing 5 of 23 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top