Dr. Paul Coudray
President at KLOÉ SA
SPIE Involvement:
Author
Publications (23)

SPIE Journal Paper | 10 September 2013
OE Vol. 52 Issue 09
KEYWORDS: Refractive index, Dispersion, Polymers, Ceramics, Thin films, Ellipsometry, Iron, Polymer thin films, Temperature metrology, Polarization

Proceedings Article | 25 October 2012 Paper
Proc. SPIE. 8466, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI
KEYWORDS: Thin films, Ellipsometry, Refractive index, Prisms, Iron, Dispersion, Polymers, Ceramics, Polymer thin films, Temperature metrology

Proceedings Article | 9 May 2012 Paper
Proc. SPIE. 8428, Micro-Optics 2012
KEYWORDS: Thin films, Lithography, Diffraction, Titanium dioxide, Interferometry, Photoresist materials, Optical encoders, Photomasks, Sol-gels, Diffraction gratings

Proceedings Article | 1 October 2011 Paper
Proc. SPIE. 8172, Optical Complex Systems: OCS11
KEYWORDS: Thin films, Refractive index, Prisms, Dispersion, Polymers, Interfaces, Silicon, Silicon films, Photorefractive polymers, Temperature metrology

Proceedings Article | 24 February 2009 Paper
Proc. SPIE. 7205, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics II
KEYWORDS: Lithography, Microfluidics, Waveguides, Laser applications, Scanning electron microscopy, Photoresist materials, Microlens, Micromirrors, Integrated optics, Multiphoton lithography

Showing 5 of 23 publications
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