Mr. Paul G. Dewa
Member Technical Staff at Corning Tropel Corp
SPIE Involvement:
Author
Publications (13)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10371, Optomechanical Engineering 2017
KEYWORDS: Contamination, Lenses, Ultraviolet radiation, Adhesives, Optical mounts

PROCEEDINGS ARTICLE | June 29, 2006
Proc. SPIE. 6269, Ground-based and Airborne Instrumentation for Astronomy
KEYWORDS: Hyperspectral imaging, Infrared imaging, Mirrors, Optical design, Diamond, Imaging systems, Spectroscopy, Distortion, Optical alignment, Diffraction gratings

PROCEEDINGS ARTICLE | May 4, 2006
Proc. SPIE. 6233, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XII
KEYWORDS: Hyperspectral imaging, Infrared imaging, Mirrors, Optical design, Imaging systems, Spectrometers, Manufacturing, Distortion, Optical alignment, Diffraction gratings

PROCEEDINGS ARTICLE | May 28, 2004
Proc. SPIE. 5377, Optical Microlithography XVII
KEYWORDS: Microscopes, Monochromatic aberrations, Optical spheres, Interferometers, Water, Interferometry, Wavefronts, Objectives, Liquids, Absorption

PROCEEDINGS ARTICLE | July 30, 2002
Proc. SPIE. 4691, Optical Microlithography XV
KEYWORDS: Lithography, Polarization, Birefringence, Interferometers, Interferometry, Wavefronts, Polarizers, Oxygen, Spatial coherence, Phase measurement

PROCEEDINGS ARTICLE | July 30, 2002
Proc. SPIE. 4691, Optical Microlithography XV
KEYWORDS: Lithography, Monochromatic aberrations, Edge detection, Imaging systems, Image processing, Manufacturing, Wavefronts, Scanning electron microscopy, Zernike polynomials, Photomasks

Showing 5 of 13 publications
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