Dr. Paul C. Montgomery
Senior Research Scientist at ICube
SPIE Involvement:
Conference Program Committee | Symposium Chair | Author
Area of Expertise:
Optical instrumentation , High resolution optical microscopy , Unmarked far field optical nanoscopy , Optical metrology , Materials characterization , Scientific communication and research culture
Profile Summary

• 1995: HDR Habilitation for Supervising Doctoral Research, development of optical nanoscopy techniques, CEM2 Laboratory, Montpellier II University, France.
• 1987: Ph.D. optical instrumentation and speckle (ESPI) interferometry, Loughborough University, Loughborough, UK.
• 1983: M.Sc. in optical metrology, Loughborough.
• 1981: B.Sc. in applied physics (2.1), Loughborough.

PROFESSIONAL:
• Present: Senior Research Scientist CNRS, ICube Laboratory, Strasbourg, France.
• 1997- 2012: Research Fellow CNRS, InESS and PHASE Laboratories, Strasbourg, France.
• 1987-1997: Research Fellow Royal Society (NATO) and CNRS, CEM2 Laboratory, Montpellier, France.

RESEARCH:
• Optical nanoscopy: general principles and new techniques for label-free far field imaging.
• Interference microscopy (PSM, CSI, WLSI) for the characterization of surface roughness of materials and biomaterials and high resolution tomography for imaging in transparent and diffuse media.
• 4D microscopy CSI with a high speed camera and FPGA processing for real time 3D characterization of surfaces (aperiodic movement).

MANAGEMENT:
• Group leader of Photonics instrumentation and processes (IPP) team (32 people) at the Engineering science, computer science and imaging (ICube) laboratory (600 people) since 2013.
• Participation in 14 research contracts (4 active, 9 as coordinator).

TEACHING:
• Training of 16 PhD students, jury member for 17 PhD's and 1 HDR.
• Teaching in optical microscopy and metrology (5th year engineers).
• Training course in scientific communication and research culture since 2002 (doctoral level).

MEMBER of SPIE, Institute of Physics (IoP) and Société Française d'Optique (SFO).

PUBLICATIONS:
• 70 articles in Int journals, 7 book ch, 2 patents.
• 90 Int confs contributions (11 inv confs).
• 30 invited Int scientific seminars.
Publications (31)

PROCEEDINGS ARTICLE | March 14, 2018
Proc. SPIE. 10500, Single Molecule Spectroscopy and Superresolution Imaging XI
KEYWORDS: Optical microscopes, Real time imaging, Super resolution, Microscopy, Dielectrics, Image acquisition, Image resolution, Spatial resolution, Near field optics, Photonic nanostructures

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Diffraction, Metrology, Interferometers, Glasses, Microscopy, Inspection, Image resolution, Interferometry, Near field optics, Photonic nanostructures

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Optical imaging, Confocal microscopy, Nanostructures, Super resolution, Digital holography, Nanoparticles, Microscopy, Molecules, Optical microscopy, Image resolution, Tomography, Super resolution microscopy, Deconvolution, Time division multiplexing

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Microscopes, Statistical analysis, Cameras, Calibration, Spectroscopy, Error analysis, Error analysis, Reflectivity, Fourier transforms, Interferometry, Imaging spectroscopy, Signal processing, Objectives

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Signal to noise ratio, Image resolution, Signal processing, Image enhancement

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Confocal microscopy, Polishing, Microscopy, Surface roughness, Interferometry, Colorimetry, Cements, Particle filters, Radium, Near field optics

Showing 5 of 31 publications
Conference Committee Involvement (6)
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
SPIE Photonics Europe
22 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
13 April 2010 | Brussels, Belgium
Optical Micro- and Nanometrology in Microsystems Technology
8 April 2008 | Strasbourg, France
Optical Micro- and Nanometrology in Microsystems Technology
5 April 2006 | Strasbourg, France
Showing 5 of 6 published special sections
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