Dr. Paul C. Montgomery
Senior Research Scientist at ICube
SPIE Involvement:
Symposium Chair | Conference Program Committee | Author
Area of Expertise:
Optical instrumentation , High resolution optical microscopy , Unmarked far field optical nanoscopy , Optical metrology , Materials characterization , Scientific communication and research culture
Profile Summary

• 1995: HDR Habilitation for Supervising Doctoral Research, development of optical nanoscopy techniques, CEM2 Laboratory, Montpellier II University, France.
• 1987: Ph.D. optical instrumentation and speckle (ESPI) interferometry, Loughborough University, Loughborough, UK.
• 1983: M.Sc. in optical metrology, Loughborough.
• 1981: B.Sc. in applied physics (2.1), Loughborough.

PROFESSIONAL:
• Present: Senior Research Scientist CNRS, ICube Laboratory, Strasbourg, France.
• 1997- 2012: Research Fellow CNRS, InESS and PHASE Laboratories, Strasbourg, France.
• 1987-1997: Research Fellow Royal Society (NATO) and CNRS, CEM2 Laboratory, Montpellier, France.

RESEARCH:
• Optical nanoscopy: general principles and new techniques for label-free far field imaging.
• Interference microscopy (PSM, CSI, WLSI) for the characterization of surface roughness of materials and biomaterials and high resolution tomography for imaging in transparent and diffuse media.
• 4D microscopy CSI with a high speed camera and FPGA processing for real time 3D characterization of surfaces (aperiodic movement).

MANAGEMENT:
• Group leader of Photonics instrumentation and processes (IPP) team (32 people) at the Engineering science, computer science and imaging (ICube) laboratory (600 people) since 2013.
• Participation in 14 research contracts (4 active, 9 as coordinator).

TEACHING:
• Training of 16 PhD students, jury member for 17 PhD's and 1 HDR.
• Teaching in optical microscopy and metrology (5th year engineers).
• Training course in scientific communication and research culture since 2002 (doctoral level).

MEMBER of SPIE, Institute of Physics (IoP) and Société Française d'Optique (SFO).

PUBLICATIONS:
• 70 articles in Int journals, 7 book ch, 2 patents.
• 90 Int confs contributions (11 inv confs).
• 30 invited Int scientific seminars.
Publications (38)

Proceedings Article | 22 July 2019
Proc. SPIE. 11060, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials IV
KEYWORDS: Optical components, Microscopes, Optical microscopes, Light sources, Super resolution, Visualization, Glasses, Microscopy, Objectives, Translucency

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Microscopes, Optical microscopes, Super resolution, Imaging systems, Microscopy, Image resolution, 3D metrology, 3D image processing

SPIE Journal Paper | 13 May 2019
OE Vol. 58 Issue 05
KEYWORDS: Super resolution, Microscopy, Microscopes, Visualization, Confocal microscopy, Objectives, Image resolution, Imaging systems, Optical microscopy, Cameras

Proceedings Article | 24 May 2018
Proc. SPIE. 10678, Optical Micro- and Nanometrology VII
KEYWORDS: Microscopes, Mirrors, Beam splitters, Interferometers, Polymers, Water, Silicon, Interferometry, Objectives, Liquids

Proceedings Article | 24 May 2018
Proc. SPIE. 10677, Unconventional Optical Imaging
KEYWORDS: Microscopes, Phase shifting, LabVIEW, Polymers, Glasses, Microscopy, Physics, Interferometry, Software development, Polymer thin films

Showing 5 of 38 publications
Conference Committee Involvement (8)
Optics and Photonics for Advanced Dimensional Metrology
29 March 2020 | Strasbourg, France
SPIE Photonics Europe
29 March 2020 | Strasbourg, France
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
SPIE Photonics Europe
22 April 2018 | Strasbourg, France
Optical Micro- and Nanometrology
13 April 2010 | Brussels, Belgium
Showing 5 of 8 Conference Committees
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