Dr. Paul E. Murphy
Senior Optical Engineer at QED Technologies
SPIE Involvement:
Conference Program Committee | Author | Instructor
Publications (22)

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Mirrors, Metrology, Optical spheres, Reflection, Interferometry, Computer generated holography, Aspheric lenses, Freeform optics, Heads up displays, Stitching interferometry

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Optical design, Calibration, Interferometry, Optical fabrication, Optical testing, Aspheric metrology, Aspheric lenses, Optics manufacturing

PROCEEDINGS ARTICLE | November 11, 2016
Proc. SPIE. 10151, Optics and Measurement International Conference 2016
KEYWORDS: Monochromatic aberrations, Polishing, Metrology, Optical spheres, Interferometry, Distortion, Computer generated holography, Aspheric lenses, Freeform optics, Surface finishing

PROCEEDINGS ARTICLE | October 11, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Optical spheres, Spatial frequencies, Interferometers, Sensors, Image resolution, Interferometry, Optical testing, Relays, Zoom lenses, Fizeau interferometers

PROCEEDINGS ARTICLE | October 11, 2015
Proc. SPIE. 9633, Optifab 2015
KEYWORDS: Photovoltaics, Polishing, Metrology, Visualization, Spatial frequencies, Linear filtering, Optical fabrication, Aspheric lenses, Tolerancing, Surface finishing

PROCEEDINGS ARTICLE | October 15, 2013
Proc. SPIE. 8884, Optifab 2013
KEYWORDS: Optical design, Optical spheres, Interferometers, Manufacturing, Wavefronts, Lens design, Optical fabrication, Aspheric lenses, Optimization (mathematics), Optics manufacturing

Showing 5 of 22 publications
Conference Committee Involvement (1)
Advances in Metrology for X-Ray and EUV Optics II
30 August 2007 | San Diego, California, United States
Course Instructor
SC1039: Evaluating Aspheres for Manufacturability
This course provides an overview of how aspheric surfaces are designed, manufactured, and measured. The primary goal of this course is to teach how to determine whether a particular aspheric surface design will be difficult to make and/or test. This will facilitate cost/performance trade off discussions between designers, fabricators, and metrologists. We will begin with a discussion of what an asphere is and how they benefit optical designs. Next we will explain various asphere geometry characteristics, especially how to evaluate local curvature plots. We will also review flaws of the standard polynomial representation, and how the Forbes polynomials can simplify asphere analysis. Then we will discuss how various specifications (such as figure error and local slope) can influence the difficulty of manufacturing an asphere. Optical assembly tolerances, however, are beyond the scope of this course - we will focus on individual elements (lenses / mirrors). The latter half of the course will focus on the more common technologies used to generate, polish, and/or measure aspheric surfaces (e.g. diamond turning, glass molding, pad polishing, interferometry). We'll give an overview of a few generic manufacturing processes (e.g. generate-polish-measure). Then we'll review the main strengths and weaknesses of each technology in the context of cost-effective asphere manufacturing.
SC850: Metrology for Modern Optical Manufacturing
This course provides attendees with a broad overview of optical surface metrology, with a focus on how to choose tools and techniques to support modern optical manufacturing processes. First we will review metrology principles and definitions of measurement capability (e.g. accuracy, lateral resolution, etc.). After establishing this basic language, we will discuss the metrology challenges that modern optical applications present (e.g. greater aperture sizes, improved accuracy specifications, and more complex shapes such as aspheres and free-forms). We will next compare the capabilities and limitations of various tools for the measurement of figure, mid-spatial frequencies, and finish (e.g. Fizeau interferometers, stylus profilometry, interference microscopes, various null tests for aspheres). Examples of "real" data from some measurement tools will be provided. Finally we will review how to identify measurement performance limitations, and techniques for extending capability such as error calibration, averaging, and subaperture stitching.
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