Paul J. Scott
at Univ of Huddersfield
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 28, 2010
Proc. SPIE. 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation
KEYWORDS: Metrology, 3D imaging standards, Data modeling, Data storage, Manufacturing, System integration, Tolerancing, Systems modeling, Global Positioning System, Standards development

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top