Dr. Paul E. Shames
Chief Image Engineer
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 27 September 2001
Proc. SPIE. 4393, Unattended Ground Sensor Technologies and Applications III
KEYWORDS: Thin films, Warfare, Nerve, Sensors, Polymers, Luminescence, Silicon, Reflectivity, Silicon films, Explosives

Proceedings Article | 21 July 2000
Proc. SPIE. 4040, Unattended Ground Sensor Technologies and Applications II
KEYWORDS: Oxides, Interferometers, Sensors, Etching, Luminescence, Silicon, Reflectivity, Silicon films, Nerve agents, Oxidation

Proceedings Article | 30 July 1999
Proc. SPIE. 3713, Unattended Ground Sensor Technologies and Applications
KEYWORDS: Oxides, FT-IR spectroscopy, Sensors, Etching, Luminescence, Molecules, Silicon, Interferometry, NOx, Oxidation

Proceedings Article | 9 October 1998
Proc. SPIE. 3466, Algorithms, Devices, and Systems for Optical Information Processing II
KEYWORDS: Holograms, Clocks, Sensors, Image processing, Computing systems, Transform theory, Computer generated holography, Optoelectronics, Image filtering, Vertical cavity surface emitting lasers

Proceedings Article | 1 May 1996
Proc. SPIE. 2693, Physics and Simulation of Optoelectronic Devices IV
KEYWORDS: Data modeling, Phase modulation, Electrodes, Phase shift keying, Modulators, Finite element methods, Electro optics, Electrooptic modulators, Electro optical modeling, Instrument modeling

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