Dr. Paul L. Voss
Associate Professor at Georgia Tech - CNRS
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 24 March 2015
Proc. SPIE. 9364, Oxide-based Materials and Devices VI
KEYWORDS: Glasses, Ultraviolet radiation, Crystals, Indium, Scanning electron microscopy, Gallium nitride, Sapphire, Indium gallium nitride, Zinc oxide, Industrial chemicals

Proceedings Article | 2 April 2014
Proc. SPIE. 8987, Oxide-based Materials and Devices V
KEYWORDS: Thin films, Light emitting diodes, Crystals, Atomic force microscopy, Scanning electron microscopy, Gallium nitride, Sapphire, Wet etching, Zinc oxide, Thin film growth

Proceedings Article | 11 March 2011
Proc. SPIE. 7940, Oxide-based Materials and Devices II
KEYWORDS: Ellipsometry, Refractive index, Data modeling, Ultraviolet radiation, Silicon, Reflectivity, Gallium nitride, Aluminum nitride, Boron, Zinc oxide

Proceedings Article | 24 February 2010
Proc. SPIE. 7603, Oxide-based Materials and Devices
KEYWORDS: Crystals, Interfaces, Ions, Silicon, Nitrogen, Zinc, Scanning electron microscopy, Gallium nitride, Indium gallium nitride, Zinc oxide

Proceedings Article | 10 June 2006
Proc. SPIE. 6344, Advanced Laser Technologies 2005
KEYWORDS: Optical filters, Lithium, Polarization, Scattering, Remote sensing, Photons, Raman spectroscopy, Raman scattering, Quantum information processing, Visibility

Showing 5 of 8 publications
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