Dr. Paulius Sakalas
at TU Dresden
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 11 June 2007
Proc. SPIE. 6600, Noise and Fluctuations in Circuits, Devices, and Materials
KEYWORDS: Data modeling, Calibration, Silicon, Doping, Monte Carlo methods, Solids, Ionization, Transistors, Heterojunctions, Device simulation

Proceedings Article | 25 May 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Radon, Data modeling, Scattering, Diffusion, Resistance, Transistors, Microwave radiation, Device simulation, Indium gallium phosphide, Advanced distributed simulations

Proceedings Article | 12 May 2003
Proc. SPIE. 5113, Noise in Devices and Circuits
KEYWORDS: Radon, Data modeling, Scattering, Denoising, Electrons, Gallium arsenide, Resistance, Aluminum, Microwave radiation, Indium gallium phosphide

Conference Committee Involvement (2)
Noise and Information in Nanoelectronics, Sensors, and Standards II
26 May 2004 | Maspalomas, Gran Canaria Island, Spain
Noise and Information in Nanoelectronics, Sensors, and Standards
2 June 2003 | Santa Fe, New Mexico, United States
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