Pavel Kajnar
R&D Mechanical Designer at Meopta - optika sro
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 June 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Confocal microscopy, Chromatic aberrations, Monochromatic aberrations, Refractive index, Sensors, Glasses, Error analysis, Colorimetry, Neodymium, Light

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