Mr. Pavel Koval
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 24, 2012
Proc. SPIE. 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV
KEYWORDS: Semiconductors, Thin films, Diffraction, Optical properties, Sensors, Crystals, X-rays, Solids, Manganese, Crystallography

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