Mr. Pedro D. V. Buschinelli
PhD Eng. Student at Univ Federal de Santa Catarina
SPIE Involvement:
Author
Area of Expertise:
Optical Metrology , Parallel computing , Image Processing
Publications (2)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Mirrors, Imaging systems, Cameras, Calibration, Image processing, Inspection, Corrosion, Clouds, Profilometers, Laser optics

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8498, Optics and Photonics for Information Processing VI
KEYWORDS: Visualization, Cameras, Image processing, Laser processing, Laser development, Profilometers, Algorithm development, Laser optics, Real time image processing, Laser systems engineering

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