Dr. Pedro Rosales
at INAOE
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 September 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Thin films, Fringe analysis, Optical lithography, Point diffraction interferometers, Image processing, Mercury, Wavefronts, Aluminum, Deposition processes, Spherical lenses

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