Mr. Peer-Olrik W. L. Wiechell
at Laser Zentrum Hannover eV
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 26, 2004
Proc. SPIE. 5252, Optical Fabrication, Testing, and Metrology
KEYWORDS: Polishing, Glasses, Laser processing, Control systems, Pyrometry, Process control, Microwave radiation, Automatic control, Surface finishing, Temperature metrology

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