Pei-Hang Li
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Fringe analysis, Image processing, Error analysis, Fourier transforms, Demodulation, Image analysis, Optical interferometry, Fractional fourier transform, Lutetium, Commercial off the shelf technology

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