Pei-Hsuan Chou
Manager at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 4 March 2013 Paper
Kai-Ten Feng, Po-Hsuan Tseng, Pei-Shuan Chiu, Jia-Lin Yang, Chun-Jie Chiu
Proceedings Volume 8649, 864908 (2013) https://doi.org/10.1117/12.2003505
KEYWORDS: 3D modeling, Detection and tracking algorithms, Skin, Pattern recognition, 3D acquisition, Cameras, Databases, Autoregressive models, Mobile devices, Target recognition

Proceedings Article | 24 September 2011 Paper
Han-Kuei Fu, Kuang-Yu Tai, Chien-Ping Wang, Pei-Ting Chou
Proceedings Volume 8123, 812310 (2011) https://doi.org/10.1117/12.894690
KEYWORDS: Light emitting diodes, Temperature metrology, Solid state lighting, Resistance, Calibration, Reliability, Measurement devices, Light sources and illumination, LED lighting, Switches

Proceedings Article | 18 August 2010 Paper
Shih-Chun Yang, Pang Lin, Han-Kuei Fu, Chien-Ping Wang, Tzung-Te Chen, An-Tse Lee, Sheng-Bang Huang, Pei-Ting Chou, Wei Wang, Fu-Jen Kao
Proceedings Volume 7784, 778419 (2010) https://doi.org/10.1117/12.860322
KEYWORDS: Light emitting diodes, Electroluminescence, Transmission electron microscopy, Failure analysis, Sapphire, Gallium nitride, Scanning electron microscopy, Diodes, Instrument modeling, Electronics

Proceedings Article | 18 August 2010 Paper
Chien-Ping Wang, Tzung-Te Chen, Shih-Chun Yang, Han-Kuei Fu, An-Tse Lee, Pei-Ting Chou, Chien-Jen Sun, Chiu-Ling Chen, Mu-Tao Chu
Proceedings Volume 7784, 77840T (2010) https://doi.org/10.1117/12.861083
KEYWORDS: Light emitting diodes, Resistance, Interfaces, Numerical simulations, Gold, Aluminum, Silver, Epoxies, Temperature metrology, Reliability

Proceedings Article | 18 August 2009 Paper
Proceedings Volume 7422, 742208 (2009) https://doi.org/10.1117/12.826743
KEYWORDS: Light emitting diodes, Temperature metrology, Solid state lighting, Resistance, Optical testing, Product engineering, Reliability, Thermography, Stars, Power supplies

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