KEYWORDS: Genetic algorithms, Detection and tracking algorithms, Machine vision, Pattern recognition, Digital image processing, Current controlled current source
This paper was presented at the conference indicated above but was previously presented and published in an earlier SPIE proceedings volume. The paper has been withdrawn from Proc. SPIE 8784 by the publisher. The citation for the earlier paper is: Peipei Gu, Zhendong Niu, Xuting Chen, and Wei Chen, "A test sheet generating algorithm based on intelligent genetic algorithm and hierarchical planning," Proc. SPIE 8334, Fourth International Conference on Digital Image Processing (ICDIP 2012), 83343S (May 1, 2012); DOI: http://dx.doi.org/10.1117/12.966822.
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