Peng Fu
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Reflectivity, Radiometry, Antennas, Black bodies, Metals, Temperature metrology, Microwave radiation, Extremely high frequency, Reflection, Polarization

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