Peng Yin
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 December 2013
Proc. SPIE. 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Reflection, Imaging systems, Sensors, Calibration, Metals, Image processing, 3D modeling, CCD cameras, 3D image processing, Structured light

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