Dr. Penny G. Warren
Detector Engineering Area Manager at Ball Aerospace
SPIE Involvement:
Conference Program Committee | Conference Chair | Author
Publications (18)

SPIE Conference Volume | August 20, 2009

SPIE Conference Volume | September 12, 2007

PROCEEDINGS ARTICLE | August 25, 2005
Proc. SPIE. 5902, Focal Plane Arrays for Space Telescopes II
KEYWORDS: Staring arrays, Visible radiation, Clocks, Sensors, Silicon, Space telescopes, Laser damage threshold, Analog electronics, Infrared telescopes, Cesium

PROCEEDINGS ARTICLE | July 29, 2002
Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing
KEYWORDS: Signal to noise ratio, Infrared sensors, Mid-IR, Optical filters, Imaging systems, Sensors, Calibration, Image segmentation, Black bodies, Atmospheric optics

PROCEEDINGS ARTICLE | July 29, 2002
Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing
KEYWORDS: Staring arrays, Nonuniformity corrections, Statistical analysis, Sensors, Video, Digital filtering, Composites, Linear filtering, Image filtering, Image enhancement

PROCEEDINGS ARTICLE | July 29, 2002
Proc. SPIE. 4719, Infrared and Passive Millimeter-wave Imaging Systems: Design, Analysis, Modeling, and Testing
KEYWORDS: Staring arrays, Super resolution, Sensors, Image processing, Video, Composites, Image restoration, Image resolution, Distortion, Image sensors

Showing 5 of 18 publications
Conference Committee Involvement (7)
Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications XII
25 January 2011 | San Francisco Airport, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications XI
19 January 2010 | San Jose, California, United States
Focal Plane Arrays for Space telescopes IV
2 August 2009 | San Diego, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications X
20 January 2009 | San Jose, California, United States
Sensors, Cameras, and Systems for Industrial/Scientific Applications IX
30 January 2008 | San Jose, California, United States
Showing 5 of 7 published special sections
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