Prof. Peter Abbamonte
Professor at Univ of Illinois
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: X-ray optics, Metrology, Interferometry, Wavefront sensors, Spectral resolution, Extreme ultraviolet, Astronomical imaging, X-ray astronomy, Diffraction gratings

PROCEEDINGS ARTICLE | February 24, 2017
Proc. SPIE. 10105, Oxide-based Materials and Devices VIII
KEYWORDS: Crystals, Copper, Dielectrics, Superconductors, Raman spectroscopy, Phonons, Raman scattering, Lanthanum, Strontium, Superconductivity

PROCEEDINGS ARTICLE | September 20, 2005
Proc. SPIE. 5932, Strongly Correlated Electron Materials: Physics and Nanoengineering
KEYWORDS: Diffraction, Ferromagnetics, Scattering, X-rays, X-ray diffraction, Magnetism, Transition metals, Oxygen, Manganese, Strontium

PROCEEDINGS ARTICLE | November 21, 2002
Proc. SPIE. 4783, Design and Microfabrication of Novel X-Ray Optics
KEYWORDS: X-ray optics, Reflection, Etching, Crystals, X-rays, Silicon, Deep reactive ion etching, Laser crystals, Monochromators, Semiconducting wafers

PROCEEDINGS ARTICLE | November 7, 2002
Proc. SPIE. 4811, Superconducting and Related Oxides: Physics and Nanoengineering V
KEYWORDS: Thin films, Diffraction, Polarization, Scattering, Luminescence, X-rays, X-ray diffraction, Superconductors, Lanthanum, Scanning tunneling microscopy

PROCEEDINGS ARTICLE | December 11, 1997
Proc. SPIE. 3151, High Heat Flux and Synchrotron Radiation Beamlines
KEYWORDS: Backscatter, Scattering, Glasses, Crystals, X-rays, Silicon, Laser scattering, Epoxies, Spherical lenses, Semiconducting wafers

Showing 5 of 9 publications
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