Dr. Peter B. Catrysse
Sr. Research Engineer at Stanford Univ
SPIE Involvement:
Fellow status | Senior status | Conference Program Committee | Author | Instructor
Publications (25)

PROCEEDINGS ARTICLE | May 13, 2015
Proc. SPIE. 9481, Image Sensing Technologies: Materials, Devices, Systems, and Applications II
KEYWORDS: Infrared imaging, Mid-IR, Optical components, Optical filters, Imaging systems, Image sensors, Image filtering, Integrated optics, CMOS technology, Nanofabrication

PROCEEDINGS ARTICLE | March 14, 2015
Proc. SPIE. 9361, Ultrafast Phenomena and Nanophotonics XIX
KEYWORDS: Metamaterials, Diffraction, Waveguides, Lenses, Interfaces, Electromagnetism, Nanofabrication, Radio propagation, Anisotropy, Structured photonic materials

PROCEEDINGS ARTICLE | February 22, 2012
Proc. SPIE. 8269, Photonic and Phononic Properties of Engineered Nanostructures II
KEYWORDS: Metamaterials, Transparency, Resonators, Scattering, Calcium, Magnetism, Free space, Electromagnetism, Electromagnetic scattering, Photonic nanostructures

PROCEEDINGS ARTICLE | September 11, 2010
Proc. SPIE. 7757, Plasmonics: Metallic Nanostructures and Their Optical Properties VIII
KEYWORDS: Oxides, Thin films, Polarization, Optical properties, Electrodes, Metals, Resistance, Magnetism, Physics, Transmittance

SPIE Journal Paper | April 1, 2010
JEI Vol. 19 Issue 02
KEYWORDS: Digital photography, Digital cameras, Cameras, Imaging systems, Image sensors, Photography, Computational imaging, Sensors, Image processing, Electronic imaging

PROCEEDINGS ARTICLE | February 12, 2010
Proc. SPIE. 7604, Integrated Optics: Devices, Materials, and Technologies XIV
KEYWORDS: Gold, Plasmonics, Waveguides, Dispersion, Metals, Dielectrics, Wave propagation, Integrated optics, Geometrical optics, Near field optics

Showing 5 of 25 publications
Conference Committee Involvement (8)
Digital Photography and Mobile Imaging XI
9 February 2015 | San Francisco, California, United States
Digital Photography X
3 February 2014 | San Francisco, California, United States
Digital Photography IX
4 February 2013 | Burlingame, California, United States
Digital Photography VIII
23 January 2012 | Burlingame, California, United States
Digital Photography VII
24 January 2011 | San Francisco Airport, California, United States
Showing 5 of 8 published special sections
Course Instructor
SC762: Device Simulation for Image Quality Evaluation
Customers judge the image quality of a digital camera by viewing the final rendered output. Achieving a high quality output depends on the multiple system components, including the optical system, imaging sensor, image processor and display device. Consequently, analyzing components singly, without reference to the characteristics of the other components, provides only a limited view of the system performance. An integrated simulation environment, that models the entire imaging pipeline, is a useful tool that improves understanding and guides design. This course will introduce computational models to simulate the scene, optics, sensor, processor, display, and human observer. Example simulations of calibrated devices and imaging algorithms will be used to clarify how specific system components influence the perceived quality of the final output.
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