Dr. Peter B. Catrysse
Sr. Research Engineer at Stanford Univ
SPIE Involvement:
Author | Instructor
Publications (27)

Proceedings Article | 5 September 2019
Proc. SPIE. 11080, Metamaterials, Metadevices, and Metasystems 2019
KEYWORDS: Metamaterials, Polarization, Scattering, Light scattering, Magnetism, Wave propagation, Rayleigh scattering, Electromagnetic scattering, Anisotropy

Proceedings Article | 14 March 2018
Proc. SPIE. 10541, Photonic and Phononic Properties of Engineered Nanostructures VIII
KEYWORDS: Infrared imaging, Plasmonics, Polarization, Imaging systems, Metals, Photonic crystals, Imaging spectroscopy, Polarimetry, Multispectral imaging, Infrared radiation

Proceedings Article | 13 May 2015
Proc. SPIE. 9481, Image Sensing Technologies: Materials, Devices, Systems, and Applications II
KEYWORDS: Infrared imaging, Mid-IR, Optical components, Optical filters, Imaging systems, Image sensors, Image filtering, Integrated optics, CMOS technology, Nanofabrication

Proceedings Article | 14 March 2015
Proc. SPIE. 9361, Ultrafast Phenomena and Nanophotonics XIX
KEYWORDS: Metamaterials, Diffraction, Waveguides, Lenses, Interfaces, Electromagnetism, Nanofabrication, Radio propagation, Anisotropy, Structured photonic materials

Proceedings Article | 22 February 2012
Proc. SPIE. 8269, Photonic and Phononic Properties of Engineered Nanostructures II
KEYWORDS: Metamaterials, Transparency, Resonators, Scattering, Calcium, Magnetism, Free space, Electromagnetism, Electromagnetic scattering, Photonic nanostructures

Showing 5 of 27 publications
Conference Committee Involvement (8)
Digital Photography and Mobile Imaging XI
9 February 2015 | San Francisco, California, United States
Digital Photography X
3 February 2014 | San Francisco, California, United States
Digital Photography IX
4 February 2013 | Burlingame, California, United States
Digital Photography VIII
23 January 2012 | Burlingame, California, United States
Digital Photography VII
24 January 2011 | San Francisco Airport, California, United States
Showing 5 of 8 Conference Committees
Course Instructor
SC762: Device Simulation for Image Quality Evaluation
Customers judge the image quality of a digital camera by viewing the final rendered output. Achieving a high quality output depends on the multiple system components, including the optical system, imaging sensor, image processor and display device. Consequently, analyzing components singly, without reference to the characteristics of the other components, provides only a limited view of the system performance. An integrated simulation environment, that models the entire imaging pipeline, is a useful tool that improves understanding and guides design. This course will introduce computational models to simulate the scene, optics, sensor, processor, display, and human observer. Example simulations of calibrated devices and imaging algorithms will be used to clarify how specific system components influence the perceived quality of the final output.
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