Dr. Peter Gawlitza
at Fraunhofer IWS Dresden
SPIE Involvement:
Author
Publications (11)

PROCEEDINGS ARTICLE | June 20, 2017
Proc. SPIE. 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV
KEYWORDS: Mirrors, Multilayers, Beam splitters, X-rays, Wavefronts, Wave propagation, Optical simulations, Picosecond phenomena, Hard x-rays, Free electron lasers

PROCEEDINGS ARTICLE | May 12, 2015
Proc. SPIE. 9510, EUV and X-ray Optics: Synergy between Laboratory and Space IV
KEYWORDS: Multilayers, Lenses, Sputter deposition, Annealing, X-rays, Silicon, Zone plates, Molybdenum, Thin film coatings, Semiconducting wafers

PROCEEDINGS ARTICLE | February 27, 2015
Proc. SPIE. 9375, MOEMS and Miniaturized Systems XIV
KEYWORDS: Microelectromechanical systems, Mirrors, Modulation, Electrodes, Scanners, High power lasers, Laser applications, Laser scanners, 3D scanning, Semiconducting wafers

PROCEEDINGS ARTICLE | October 8, 2014
Proc. SPIE. 9210, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
KEYWORDS: Temporal coherence, Mirrors, Multilayers, Beam splitters, X-rays, Coating, Reflectivity, Wavefronts, Adaptive optics, Picosecond phenomena

PROCEEDINGS ARTICLE | September 17, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Mirrors, Multilayers, Interfaces, Ions, Silicon, Diffusion, Reflectivity, Extreme ultraviolet, Molybdenum, Thin film coatings

PROCEEDINGS ARTICLE | May 3, 2013
Proc. SPIE. 8778, Advances in X-ray Free-Electron Lasers II: Instrumentation
KEYWORDS: Mirrors, Multilayers, Beam splitters, X-rays, X-ray diffraction, Coating, Reflectivity, Picosecond phenomena, X-ray imaging, Free electron lasers

Showing 5 of 11 publications
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