Dr. Peter Gawlitza Profile

Dr. Peter Gawlitza

at Fraunhofer IWS Dresden

SPIE Involvement:

Author

Publications (13)

Proceedings Article | 10 November 2022 Presentation + Paper

Hard x-ray nanotomography at the P05 imaging beamline at PETRA III

Silja Flenner, Johannes Hagemann, Malte Storm, Adam Kubec, Peng Qi, Christian David, Elena Longo, Sven Niese, Peter Gawlitza, Berit Zeller-Plumhoff, Jan Reimers, Martin Müller, Imke Greving

Proceedings Volume 12242, 122420L (2022) https://doi.org/10.1117/12.2632706

KEYWORDS: Sensors, Cameras, X-rays, Phase contrast, Near field optics, Holography, Near field, Spatial resolution, Microscopes, Hard x-rays

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Proceedings Article | 4 October 2022 Presentation + Paper

Hard x-ray wavefront engineering for aberration correction and beam shaping

Christian Schroer, Frank Seiboth, Andreas Schropp, Silvio Achilles, Martin Seyrich, Svenja Patjens, Micheal Stuckelberger, Jan Garrevoet, Vanessa Galbierz, Gerald Falkenberg, Adam Kubec, Christian David, Sven Niese, Peter Gawlitza

Proceedings Volume 12240, 122400J (2022) https://doi.org/10.1117/12.2633458

KEYWORDS: Wave propagation, Wavefronts, X-rays, Beam shaping, Beam propagation method, X-ray optics, Aberration correction, Phase shifts, Synchrotron radiation

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Proceedings Article | 20 June 2017 Paper

A hard x-ray split-and-delay unit for the HED instrument at the European XFEL

Sebastian Roling, Victor Kärcher, Liubov Samoylova, Karen Appel, Stefan Braun, Peter Gawlitza, Frank Siewert, Ulf Zastrau, Matthias Rollnik, Frank Wahlert, Helmut Zacharias

Proceedings Volume 10237, 1023713 (2017) https://doi.org/10.1117/12.2265750

KEYWORDS: Picosecond phenomena, Free electron lasers, Mirrors, Hard x-rays, Beam splitters, Multilayers, Wavefronts, Wave propagation, Optical simulations, X-rays

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Proceedings Article | 12 May 2015 Paper

Low-stress coatings for sputtered-sliced Fresnel zone plates and multilayer Laue lenses

Stefan Braun, Adam Kubec, Peter Gawlitza, Maik Menzel, Andreas Leson

Proceedings Volume 9510, 95100L (2015) https://doi.org/10.1117/12.2178851

KEYWORDS: Multilayers, Silicon, Molybdenum, Zone plates, X-rays, Thin film coatings, Lenses, Semiconducting wafers, Annealing, Sputter deposition

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Proceedings Article | 27 February 2015 Paper

Centimeter-scale MEMS scanning mirrors for high power laser application

F. Senger, U. Hofmann, Thomas von Wantoch, C. Mallas, J. Janes, W. Benecke, Patrick Herwig, P. Gawlitza, Moises Ortega Delgado, C. Grune, J. Hannweber, A. Wetzig

Proceedings Volume 9375, 937509 (2015) https://doi.org/10.1117/12.2079600

KEYWORDS: Mirrors, Microelectromechanical systems, Semiconducting wafers, High power lasers, Laser applications, Scanners, Modulation, Electrodes, Laser scanners, 3D scanning

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Proceedings Article | 8 October 2014 Paper

A hard x-ray split-and-delay unit for the HED experiment at the European XFEL

Sebastian Roling, Karen Appel, Stefan Braun, Alexey Buzmakov, O. Chubar, Peter Gawlitza, Liubov Samoylova, Björn Siemer, Evgeny Schneidmiller, Harald Sinn, Frank Siewert, Thomas Tschentscher, Frank Wahlert, Michael Wöstmann, Mikhail Yurkov, Helmut Zacharias

Proceedings Volume 9210, 92100B (2014) https://doi.org/10.1117/12.2061879

KEYWORDS: Mirrors, Multilayers, X-rays, Coating, Wavefronts, Beam splitters, Adaptive optics, Picosecond phenomena, Reflectivity, Temporal coherence

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Proceedings Article | 17 September 2014 Paper

Specific aspects of roughness and interface diffusion in non-periodic Mo/Si multilayers

Stefan Braun, Peter Gawlitza, Maik Menzel, Wolfgang Friedrich, Jürgen Schmidt, Andreas Leson

Proceedings Volume 9207, 920707 (2014) https://doi.org/10.1117/12.2062193

KEYWORDS: Reflectivity, Multilayers, Interfaces, Mirrors, Extreme ultraviolet, Diffusion, Molybdenum, Silicon, Thin film coatings, Ions

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Proceedings Article | 3 May 2013 Paper

A split- and delay-unit for the European XFEL

Sebastian Roling, Stefan Braun, Peter Gawlitza, Liubov Samoylova, Björn Siemer, Harald Sinn, Frank Siewert, Frank Wahlert, Michael Wöstmann, Helmut Zacharias

Proceedings Volume 8778, 87781G (2013) https://doi.org/10.1117/12.2027029

KEYWORDS: Mirrors, Beam splitters, Multilayers, X-rays, Coating, Reflectivity, Free electron lasers, Picosecond phenomena, X-ray diffraction, X-ray imaging

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SPIE Journal Paper | 3 May 2012

Atomic-hydrogen cleaning of Sn from Mo/Si and DLC/Si extreme ultraviolet multilayer mirrors

Wouter Soer, Maarten van Herpen, Martin Jak, Peter Gawlitza, Stefan Braun, Nikolay Salashchenko, Vadim Banine

JM3, Vol. 11, Issue 02, 021118, (May 2012) https://doi.org/10.1117/12.10.1117/1.JMM.11.2.021118

KEYWORDS: Tin, Mirrors, Extreme ultraviolet, Silicon, Reflectivity, Multilayers, Molybdenum, Hydrogen, Infrared radiation, Contamination

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Proceedings Article | 29 September 2010 Paper

DLC/Si multilayer mirrors for EUV radiation

Peter Gawlitza, Stefan Braun, Andreas Leson, Wouter Soer, Martin Jak, Vadim Banine

Proceedings Volume 7802, 78020A (2010) https://doi.org/10.1117/12.861165

KEYWORDS: Extreme ultraviolet, Multilayers, Mirrors, Reflectivity, Silicon, Antireflective coatings, Ions, Tin, Optical filters, Infrared radiation

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Proceedings Article | 16 September 2008 Paper

Ion beam sputtering of x-ray multilayer mirrors

Peter Gawlitza, Stefan Braun, Georg Dietrich, Maik Menzel, Stefan Schädlich, Andreas Leson

Proceedings Volume 7077, 707703 (2008) https://doi.org/10.1117/12.796830

KEYWORDS: Mirrors, Multilayers, Ion beams, Ions, Coating, X-rays, Polishing, Silicon, Surface finishing, Quartz

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Proceedings Article | 11 September 2006 Paper

Ion-beam sputter deposition of x-ray multilayer optics on large areas

Peter Gawlitza, Stefan Braun, Sebastian Lipfert, Andreas Leson

Proceedings Volume 6317, 63170G (2006) https://doi.org/10.1117/12.680618

KEYWORDS: Multilayers, Ion beams, Interfaces, X-ray optics, Mirrors, Ions, X-rays, Sputter deposition, Reflectivity, Extreme ultraviolet

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Proceedings Article | 18 October 2004 Paper

Design and development of an optical system for EUV-microscopy

Thomas Foltyn, Klaus Bergmann, Stefan Braun, Peter Gawlitza, Andreas Leson, Willy Neff, Konstantin Walter

Proceedings Volume 5533, (2004) https://doi.org/10.1117/12.559675

KEYWORDS: Mirrors, Reflectivity, Molybdenum, Objectives, Extreme ultraviolet, X-ray technology, Copper, X-ray lasers, X-ray lithography, X-rays

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Showing 5 of 13 publications

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