Peter Giesen
at Holst Ctr
SPIE Involvement:
Author
Publications (10)

Proceedings Article | 10 December 2009
Proc. SPIE. 7520, Lithography Asia 2009
KEYWORDS: Gold, Lithography, Optical lithography, Electrodes, Silicon, Transistors, Maskless lithography, Critical dimension metrology, Semiconducting wafers, Flexible circuits

Proceedings Article | 21 March 2008
Proc. SPIE. 6921, Emerging Lithographic Technologies XII
KEYWORDS: Thin films, Lithography, Optical lithography, Image processing, Silicon, Scanning electron microscopy, Transistors, Optical fiber cables, Critical dimension metrology, Semiconducting wafers

Proceedings Article | 8 September 2005
Proc. SPIE. 5877, Optomechanics 2005
KEYWORDS: Optomechanical design, Telescopes, Mirrors, Metrology, Stars, Sensors, Interferometry, Kinematics, Mirror mounts, Optical instrument design

Proceedings Article | 8 September 2005
Proc. SPIE. 5877, Optomechanics 2005
KEYWORDS: Actuators, Optomechanical design, Telescopes, Mirrors, Titanium, Stars, Sensors, Space telescopes, Planets, Jupiter

Proceedings Article | 30 September 2004
Proc. SPIE. 5528, Space Systems Engineering and Optical Alignment Mechanisms
KEYWORDS: Actuators, Telescopes, Mirrors, Stars, Photons, Interferometry, Space telescopes, Computer aided design, Chemical elements, Telescopic pixel displays

Showing 5 of 10 publications
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