Dr. Peter He
at Tuskegee Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 March 2006
Proc. SPIE. 6155, Data Analysis and Modeling for Process Control III
KEYWORDS: Semiconductors, Principal component analysis, Visual analytics, Data modeling, Visualization, Data processing, Process control, Semiconductor manufacturing, Chemometrics, Dynamical systems

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top