Dr. Peter Kühmstedt
at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (62)

PROCEEDINGS ARTICLE | May 15, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Near infrared, 3D acquisition, Sensors, Sensor networks, 3D metrology, Projection systems, Sensor fusion, Motion analysis, Sensor technology

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Thermography, Mid-IR, Polymethylmethacrylate, 3D applications, Cameras, Glasses, 3D metrology, Gas lasers, 3D image processing

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Sensors, 3D metrology, Projection systems, Device simulation

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Thermography, Mid-IR, Cameras, 3D modeling, 3D metrology, Infrared radiation

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Hyperspectral imaging, Sensors, 3D metrology, Projection systems, 3D image processing, Structured light

PROCEEDINGS ARTICLE | July 11, 2017
Proc. SPIE. 10331, Optics for Arts, Architecture, and Archaeology VI
KEYWORDS: Mobile devices, 3D acquisition, Cameras, Scanners, Forensic science, Power supplies, 3D modeling, Data acquisition, Laser scanners, 3D metrology, 3D scanning, Rapid manufacturing, Digital forensics

Showing 5 of 62 publications
Conference Committee Involvement (9)
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications IV
20 April 2015 | Baltimore, Maryland, United States
Showing 5 of 9 published special sections
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