Dr. Peter Kühmstedt
at Fraunhofer-IOF
SPIE Involvement:
Conference Program Committee | Author
Publications (68)

Proceedings Article | 21 June 2019
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Backscatter, Imaging systems, Sensors, Modulators, Computer simulations, 3D modeling, 3D metrology, Projection systems, Reconstruction algorithms, Photometry, Structured light

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Thermography, Mid-IR, 3D image reconstruction, Cameras, 3D modeling, Quality measurement, 3D metrology, Gas lasers, Device simulation, 3D image processing

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Long wavelength infrared, Thermography, Imaging systems, Cameras, Sensors, Calibration, High speed cameras, 3D metrology, 3D image processing, Temperature metrology

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Near infrared, 3D acquisition, Cameras, Sensors, Calibration, 3D modeling, Sensor networks, 3D metrology, 3D scanning, 3D image processing

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: 3D acquisition, Scanners, 3D modeling, 3D metrology, Reconstruction algorithms, 3D image processing

Proceedings Article | 13 May 2019
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Short wave infrared radiation, Fringe analysis, Light emitting diodes, Cameras, Sensors, Calibration, 3D modeling, 3D metrology, Projection systems, Infrared radiation, 3D image processing, Structured light

Showing 5 of 68 publications
Conference Committee Involvement (10)
Dimensional Optical Metrology and Inspection for Practical Applications VIV
26 April 2020 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications V
20 April 2016 | Baltimore, Maryland, United States
Showing 5 of 10 published special sections
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