Prof. Peter Lehmann
Chair/Measurement Technology at Univ Kassel
SPIE Involvement:
Conference Program Committee | Conference Chair | Editor | Author
Publications (35)

SPIE Conference Volume | July 18, 2017

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical components, Mirrors, Light sources, Phase shifting, Interferometers, Cameras, Sensors, Interferometry, Head, Precision measurement, 3D metrology, Aspheric lenses, Surface finishing, Line scan image sensors

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Optical components, Nanostructures, Interferometers, Cameras, Image processing, Interferometry, Ultrasonics, Transducers, Distance measurement, 3D metrology, Environmental sensing

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Confocal microscopy, Diffraction, Edge detection, 3D surface sensing, Calibration, Optical coherence tomography, Interferometry, 3D metrology, Signal analyzers

SPIE Journal Paper | December 7, 2016
OE Vol. 55 Issue 12
KEYWORDS: Speckle, Metrology, Optical metrology, Image processing, Physics, Speckle metrology, Laser metrology, Interferometry, Nondestructive evaluation, Electrical engineering

PROCEEDINGS ARTICLE | April 26, 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Confocal microscopy, Microscopes, Diffraction, Apodization, Light emitting diodes, Mirau interferometers, Imaging systems, Interferometers, Interferometers, Interferometry, Tomography, 3D metrology, Objectives, Optical tomography, Blue light emitting diodes

Showing 5 of 35 publications
Conference Committee Involvement (11)
Optical Micro- and Nanometrology
25 April 2018 | Strasbourg, France
Optical Measurement Systems for Industrial Inspection X
26 June 2017 | Munich, Germany
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Optical Measurement Systems for Industrial Inspection IX
22 June 2015 | Munich, Germany
Optical Micro- and Nanometrology
15 April 2014 | Brussels, Belgium
Showing 5 of 11 published special sections
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